Description
"Automated Dependence Plots
David Inouye (Purdue University)*; Liu Leqi (Carnegie Mellon University); Joon Sik Kim (Carnegie Mellon University); Bryon Aragam (University of Chicago); Pradeep Ravikumar (Carnegie Mellon University)
In practical applications of machine learning, it is necessary to look beyond standard metrics such as test accuracy in order to validate various qualitative properties of a model. Partial dependence plots (PDP), including instance-specific PDPs (i.e., ICE plots), have been widely used as a visual tool to understand or validate a model. Yet, current PDPs suffer from two main drawbacks: (1) a user must manually sort or select interesting plots, and (2) PDPs are usually limited to plots along a single feature. To address these drawbacks, we formalize a method for automating the selection of interesting PDPs and extend PDPs beyond showing single features to show the model response along arbitrary directions, for example in raw feature space or a latent space arising from some generative model. We demonstrate the usefulness of our automated dependence plots (ADP) across multiple use-cases and datasets including model selection, bias detection, understanding out-of-sample behavior, and exploring the latent space of a generative model. The code is available at